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 LTC2293/LTC2292/LTC2291 Dual 12-Bit, 65/40/25Msps Low Power 3V ADCs
FEATURES

DESCRIPTIO
Integrated Dual 12-Bit ADCs Sample Rate: 65Msps/40Msps/25Msps Single 3V Supply (2.7V to 3.4V) Low Power: 400mW/235mW/150mW 71dB SNR up to 70MHz Input 85dB SFDR up to 70MHz Input 110dB Channel Isolation at 100MHz Multiplexed or Separate Data Bus Flexible Input: 1VP-P to 2VP-P Range 575MHz Full Power Bandwidth S/H Clock Duty Cycle Stabilizer Shutdown and Nap Modes Pin Compatible Family 80Msps: LTC2294 (12-Bit), LTC2299 (14-Bit) 65Msps: LTC2293 (12-Bit), LTC2298 (14-Bit) 40Msps: LTC2292 (12-Bit), LTC2297 (14-Bit) 25Msps: LTC2291 (12-Bit), LTC2296 (14-Bit) 10Msps: LTC2290 (12-Bit), LTC2295 (14-Bit) 64-Pin (9mm x 9mm) QFN Package Wireless and Wired Broadband Communication Imaging Systems Spectral Analysis Portable Instrumentation
The LTC(R)2293/LTC2292/LTC2291 are 12-bit 65Msps/ 40Msps/25Msps, low power dual 3V A/D converters designed for digitizing high frequency, wide dynamic range signals. The LTC2293/LTC2292/LTC2291 are perfect for demanding imaging and communications applications with AC performance that includes 71dB SNR and 85dB SFDR for signals well beyond the Nyquist frequency. DC specs include 0.3LSB INL (typ), 0.15LSB DNL (typ) and no missing codes over temperature. The transition noise is a low 0.25LSBRMS. A single 3V supply allows low power operation. A separate output supply allows the outputs to drive 0.5V to 3.3V logic. An optional multiplexer allows both channels to share a digital output bus. A single-ended CLK input controls converter operation. An optional clock duty cycle stabilizer allows high performance at full speed for a wide range of clock duty cycles.
, LTC and LT are registered trademarks of Linear Technology Corporation. All other trademarks are the property of their respective owners.
APPLICATIO S

TYPICAL APPLICATIO
+
ANALOG INPUT A INPUT S/H
OVDD 12-BIT PIPELINED ADC CORE OUTPUT DRIVERS D11A
* * *
-
D0A OGND
MUX CLK B CLOCK/DUTY CYCLE CONTROL
SNR (dBFS)
CLK A
CLOCK/DUTY CYCLE CONTROL
OVDD
+
ANALOG INPUT B INPUT S/H
-
12-BIT PIPELINED ADC CORE
OUTPUT DRIVERS
D11B
* * *
D0B OGND
229321 TA01
U
LTC2293: SNR vs Input Frequency, -1dB, 2V Range, 65Msps
72 71 70 69 68 0 100 150 50 INPUT FREQUENCY (MHz) 200
229321 TA02
U
U
229321f
1
LTC2293/LTC2292/LTC2291
ABSOLUTE AXI U RATI GS
PACKAGE/ORDER I FOR ATIO
TOP VIEW
64 GND 63 VDD 62 SENSEA 61 VCMA 60 MODE 59 SHDNA 58 OEA 57 OFA 56 DA11 55 DA10 54 DA9 53 DA8 52 DA7 51 DA6 50 OGND 49 OVDD
OVDD = VDD (Notes 1, 2)
Supply Voltage (VDD) ................................................. 4V Digital Output Ground Voltage (OGND) ....... -0.3V to 1V Analog Input Voltage (Note 3) ..... -0.3V to (VDD + 0.3V) Digital Input Voltage .................... -0.3V to (VDD + 0.3V) Digital Output Voltage ................ -0.3V to (OVDD + 0.3V) Power Dissipation ............................................ 1500mW Operating Temperature Range LTC2293C, LTC2292C, LTC2291C ........... 0C to 70C LTC2293I, LTC2292I, LTC2291I ..........-40C to 85C Storage Temperature Range ..................-65C to 125C Lead Temperature (Soldering, 10 sec).................. 300C
AINA+ 1 AINA- 2 REFHA 3 REFHA 4 REFLA 5 REFLA 6 VDD 7 CLKA 8 CLKB 9 VDD 10 REFLB 11 REFLB 12 REFHB 13 REFHB 14 AINB- 15 AINB+ 16
65
48 DA5 47 DA4 46 DA3 45 DA2 44 DA1 43 DA0 42 NC 41 NC 40 OFB 39 DB11 38 DB10 37 DB9 36 DB8 35 DB7 34 DB6 33 DB5
UP PACKAGE 64-LEAD (9mm x 9mm) PLASTIC QFN TJMAX = 125C, JA = 20C/W EXPOSED PAD (PIN 65) IS GND AND MUST BE SOLDERED TO PCB
ORDER PART NUMBER LTC2293CUP LTC2293IUP LTC2292CUP LTC2292IUP LTC2291CUP LTC2291IUP
Consult LTC Marketing for parts specified with wider operating temperature ranges. *The temperature grade is identified by a label on the shipping container.
CO VERTER CHARACTERISTICS
PARAMETER Resolution (No Missing Codes) Integral Linearity Error Differential Linearity Error Offset Error Gain Error Offset Drift Full-Scale Drift Gain Matching Offset Matching Transition Noise CONDITIONS
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. (Note 4)
MIN 12 -1.4 -0.8 -12 -2.5 LTC2293 TYP MAX MIN 12 -1.4 -0.7 -12 -2.5 LTC2292 TYP MAX MIN 12 -1.3 -0.7 -12 -2.5 LTC2291 TYP MAX UNITS Bits LSB LSB mV %FS V/C ppm/C ppm/C %FS mV LSBRMS
229321f
Differential Analog Input (Note 5) Differential Analog Input (Note 6) External Reference Internal Reference External Reference External Reference SENSE = 1V

0.3 0.15 2 0.5 10 30 15 0.3 2 0.25
1.4 0.8 12 2.5
GND 17 VDD 18 SENSEB 19 VCMB 20 MUX 21 SHDNB 22 OEB 23 NC 24 NC 25 DB0 26 DB1 27 DB2 28 DB3 29 DB4 30 OGND 31 OVDD 32
QFN PART* MARKING LTC2293UP LTC2292UP LTC2291UP
0.3 0.15 2 0.5 10 30 15 0.3 2 0.25
1.4 0.7 12 2.5
0.3 0.15 2 0.5 10 30 15 0.3 2 0.25
1.3 0.7 12 2.5
2
U
W
U
U
WW
W
U
LTC2293/LTC2292/LTC2291
A ALOG I PUT
SYMBOL VIN VIN,CM IIN ISENSE IMODE tAP tJITTER CMRR PARAMETER
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. (Note 4)
CONDITIONS 2.7V < VDD < 3.4V (Note 7) Differential Input (Note 7) 0V < AIN+, AIN- < VDD 0V < SENSEA, SENSEB < 1V 0V < MODE < VDD

Analog Input Range (AIN+ -AIN-) Analog Input Common Mode Analog Input Leakage Current SENSEA, SENSEB Input Leakage MODE Input Leakage Current Sample-and-Hold Acquisition Delay Time Sample-and-Hold Acquisition Delay Time Jitter Analog Input Common Mode Rejection Ratio Full Power Bandwidth
DY A IC ACCURACY
SYMBOL SNR PARAMETER Signal-to-Noise Ratio
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. AIN = -1dBFS. (Note 4)
CONDITIONS 5MHz Input 12.5MHz Input 20MHz Input 30MHz Input 70MHz Input 140MHz Input SFDR Spurious Free Dynamic Range 2nd or 3rd Harmonic 5MHz Input 12.5MHz Input 20MHz Input 30MHz Input 70MHz Input 140MHz Input SFDR Spurious Free Dynamic Range 4th Harmonic or Higher 5MHz Input 12.5MHz Input 20MHz Input 30MHz Input 70MHz Input 140MHz Input S/(N+D) Signal-to-Noise Plus Distortion Ratio 5MHz Input 12.5MHz Input 20MHz Input 30MHz Input 70MHz Input 140MHz Input IMD Intermodulation Distortion Crosstalk fIN = Nyquist, Nyquist + 1MHz fIN = Nyquist

U
WU
U
MIN 1 -1 -3 -3
TYP 1V to 2V 1.5
MAX 1.9 1 3 3
UNITS V V A A A ns psRMS dB MHz
0 0.2 80 Figure 8 Test Circuit 575
MIN
LTC2293 TYP MAX 71.3
MIN
LTC2292 TYP MAX 71.4
MIN 70.1
LTC2291 TYP MAX 71.4 71.2
UNITS dB dB dB dB
69.6 69.6 71.3 71.3 71 90 74 74 90 85 80 90 79 78 90 90 90 71.3 69.4 69.4 71.2 71.1 69.9 90 -110
71.3 71.1 70.7 90 75 90 85 80 90 80 90 90 90 71.4 69.8 71.2 70.9 69.9 90 -110 70.8 69.8 90 -110 90 90 71.4 71.2 85 80 90 90 70.9 70.6 90 90
dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB dB
229321f
3
LTC2293/LTC2292/LTC2291
I TER AL REFERE CE CHARACTERISTICS
PARAMETER VCM Output Voltage VCM Output Tempco VCM Line Regulation VCM Output Resistance CONDITIONS IOUT = 0
DIGITAL I PUTS A D DIGITAL OUTPUTS
SYMBOL VIH VIL IIN CIN LOGIC OUTPUTS OVDD = 3V COZ ISOURCE ISINK VOH VOL OVDD = 2.5V VOH VOL OVDD = 1.8V VOH VOL High Level Output Voltage Low Level Output Voltage IO = -200A IO = 1.6mA High Level Output Voltage Low Level Output Voltage IO = -200A IO = 1.6mA Hi-Z Output Capacitance Output Source Current Output Sink Current High Level Output Voltage Low Level Output Voltage PARAMETER High Level Input Voltage Low Level Input Voltage Input Current Input Capacitance CONDITIONS VDD = 3V VDD = 3V LOGIC INPUTS (CLK, OE, SHDN, MUX)
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. (Note 4)
MIN

4
U
U
U
U
U
(Note 4)
MIN 1.475 TYP 1.500 30 3 4 MAX 1.525 UNITS V ppm/C mV/V
2.7V < VDD < 3.3V -1mA < IOUT < 1mA
TYP
MAX
UNITS V
2 0.8 -10 3 10
V A pF
VIN = 0V to VDD (Note 7)
OE = High (Note 7) VOUT = 0V VOUT = 3V IO = -10A IO = -200A IO = 10A IO = 1.6mA

3 50 50 2.7 2.995 2.99 0.005 0.09 2.49 0.09 1.79 0.09 0.4
pF mA mA V V V V V V V V
229321f
LTC2293/LTC2292/LTC2291
POWER REQUIRE E TS
SYMBOL VDD OVDD IVDD PDISS PSHDN PNAP PARAMETER Analog Supply Voltage Output Supply Voltage Supply Current Power Dissipation Shutdown Power (Each Channel) Nap Mode Power (Each Channel) CONDITIONS (Note 9) (Note 9)
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. (Note 8)
MIN

Both ADCs at fS(MAX) Both ADCs at fS(MAX) SHDN = H, OE = H, No CLK SHDN = H, OE = L, No CLK
The denotes the specifications which apply over the full operating temperature range, otherwise specifications are at TA = 25C. (Note 4)
SYMBOL fs tL PARAMETER CLK Low Time CONDITIONS

TI I G CHARACTERISTICS
Sampling Frequency (Note 9) Duty Cycle Stabilizer Off Duty Cycle Stabilizer On (Note 7) Duty Cycle Stabilizer Off Duty Cycle Stabilizer On (Note 7)
tH
CLK High Time
tAP tD tMD
Sample-and-Hold Aperture Delay CLK to DATA Delay Data Access Time After OE CL = 5pF (Note 7) CL = 5pF (Note 7)

MUX to DATA Delay CL = 5pF (Note 7)
BUS Relinquish Time (Note 7) Pipeline Latency
Note 1: Absolute Maximum Ratings are those values beyond which the life of a device may be impaired. Note 2: All voltage values are with respect to ground with GND and OGND wired together (unless otherwise noted). Note 3: When these pin voltages are taken below GND or above VDD, they will be clamped by internal diodes. This product can handle input currents of greater than 100mA below GND or above VDD without latchup. Note 4: VDD = 3V, fSAMPLE = 65MHz (LTC2293), 40MHz (LTC2292), or 25MHz (LTC2291), input range = 2VP-P with differential drive, unless otherwise noted.
UW
LTC2293 TYP MAX 3 3 133 400 2 15 3.4 3.6 150 450
MIN 2.7 0.5
LTC2292 TYP MAX 3 3 78 235 2 15 3.4 3.6 95 285
MIN 2.7 0.5
LTC2291 TYP MAX 3 3 50 150 2 15 3.4 3.6 60 180
UNITS V V mA mW mW mW
2.7 0.5
UW
MIN 1 7.3 5 7.3 5
LTC2293 TYP MAX 65 7.7 7.7 7.7 7.7 0 500 500 500 500
MIN 1 11.8 5 11.8 5
LTC2292 TYP MAX 40 12.5 12.5 12.5 12.5 0 500 500 500 500
MIN 1 18.9 5 18.9 5
LTC2291 TYP MAX 25 20 20 20 20 0 500 500 500 500
UNITS MHz ns ns ns ns ns
1.4 1.4
2.7 2.7 4.3 3.3 6
5.4 5.4 10 8.5
1.4 1.4
2.7 2.7 4.3 3.3 6
5.4 5.4 10 8.5
1.4 1.4
2.7 2.7 4.3 3.3 6
5.4 5.4 10 8.5
ns ns ns ns Cycles
Note 5: Integral nonlinearity is defined as the deviation of a code from a straight line passing through the actual endpoints of the transfer curve. The deviation is measured from the center of the quantization band. Note 6: Offset error is the offset voltage measured from -0.5 LSB when the output code flickers between 0000 0000 0000 and 1111 1111 1111. Note 7: Guaranteed by design, not subject to test. Note 8: VDD = 3V, fSAMPLE = 65MHz (LTC2293), 40MHz (LTC2292), or 25MHz (LTC2291), input range = 1VP-P with differential drive. The supply current and power dissipation are the sum total for both channels with both channels active. Note 9: Recommended operating conditions.
229321f
5
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2293/LTC2292/LTC2291: Crosstalk vs Input Frequency
-100 -105 -110 -115 -120 -125 -130 0 20 40 60 80 INPUT FREQUENCY (MHz) 100
229321 G01
DNL ERROR (LSB)
INL ERROR (LSB)
CROSSTALK (dB)
LTC2293: 8192 Point FFT, fIN = 5MHz, -1dB, 2V Range, 65Msps
0 -10 -20 -30 0 -10 -20 -30
AMPLITUDE (dB)
AMPLITUDE (dB)
-40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 20 25 FREQUENCY (MHz) 30
229321 G04
-40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 20 25 FREQUENCY (MHz) 30
229321 G05
AMPLITUDE (dB)
LTC2293: 8192 Point FFT, fIN = 140MHz, -1dB, 2V Range, 65Msps
0 -10 -20 -30 0 -10 -20 -30
AMPLITUDE (dB)
-40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 20 25 FREQUENCY (MHz) 30
229321 G07
AMPLITUDE (dB)
-60 -70 -80 -90 -100 -110 -120 0 5 10 15 20 25 FREQUENCY (MHz) 30
229321 G08
COUNT
6
UW
LTC2293: Typical INL, 2V Range, 65Msps
1.00 0.75 0.50 0.25 0 -0.25 -0.50 -0.75 -1.00 0 1024 2048 CODE 3072 4096
229321 G02
LTC2293: Typical DNL, 2V Range, 65Msps
1.00 0.75 0.50 0.25 0 -0.25 -0.50 -0.75 -1.00 0 1024 2048 CODE 3072 4096
229321 G03
LTC2293: 8192 Point FFT, fIN = 30MHz, -1dB, 2V Range, 65Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120
LTC2293: 8192 Point FFT, fIN = 70MHz, -1dB, 2V Range, 65Msps
0
5
10 15 20 25 FREQUENCY (MHz)
30
229321 G06
LTC2293: 8192 Point 2-Tone FFT, fIN = 28.2MHz and 26.8MHz, -1dB, 2V Range 65Msps
70000 60000 50000 40000 30000 20000 10000
LTC2293: Grounded Input Histogram, 65Msps
61496
-40 -50
2123 0 2042 2043 CODE
1910 2044
229321 G09
229321f
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2293: SNR vs Input Frequency, -1dB, 2V Range, 65Msps
72
100 95 90
SNR AND SFDR (dBFS)
71
SFDR (dBFS)
SNR (dBFS)
70
69
68
0
100 150 50 INPUT FREQUENCY (MHz)
LTC2293: SNR and SFDR vs Clock Duty Cycle, 65Msps
100 95
SNR AND SFDR (dBFS)
80
SFDR: DCS ON
SNR (dBc AND dBFS)
90 85 80 75
SFDR (dBc AND dBFS)
SFDR: DCS OFF
SNR: DCS ON 70 65 30 SNR: DCS OFF 35 40 60 CLOCK DUTY CYCLE (%) 45 50 55 65 70
LTC2293: IVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB
155 145 135 1V RANGE 125 115 105 95 2V RANGE
IOVDD (mA)
IVDD (mA)
0
10
20 30 40 50 60 SAMPLE RATE (Msps)
UW
229321 G10
LTC2293: SFDR vs Input Frequency, -1dB, 2V Range, 65Msps
110
LTC2293: SNR and SFDR vs Sample Rate, 2V Range, fIN = 5MHz, -1dB
100
SFDR
85 80 75 70 65
90
80 SNR 70
60 0 50 150 INPUT FREQUENCY (MHz) 100 200
229321 G11
200
0
20
60 80 40 SAMPLE RATE (Msps)
100
229321 G12
LTC2293: SNR vs Input Level, fIN = 30MHz, 2V Range, 65Msps
120
dBFS 70 60 50 40 30 20 10 0 -60 -50 - 40 -30 -20 INPUT LEVEL (dBFS) -10 0 dBc
LTC2293: SFDR vs Input Level, fIN = 30MHz, 2V Range, 65Msps
110 100 90 80 70 60 50 40 30 20 -60 -50 - 40 -30 -20 INPUT LEVEL (dBFS) -10 0 90dBc SFDR REFERENCE LINE dBc dBFS
229321 G13
229321 G14
229321 G15
LTC2293: IOVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB, OVDD = 1.8V
12 10 8 6 4 2 0
70
80
0
10
229321 G16
20 30 40 50 60 SAMPLE RATE (Msps)
70
80
229321 G17
229321f
7
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2292: Typical INL, 2V Range, 40Msps
1.00 0.75 0.50 DNL ERROR (LSB) INL ERROR (LSB) 0.25 0 -0.25 -0.50 -0.75 -1.00 0 1024 2048 CODE 3072 4096
229321 G18
AMPLITUDE (dB)
LTC2292: 8192 Point FFT, fIN = 30MHz, -1dB, 2V Range, 40Msps
0 -10 -20 -30
AMPLITUDE (dB)
AMPLITUDE (dB)
AMPLITUDE (dB)
-40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 FREQUENCY (MHz) 20
229321 G21
LTC2292: 8192 Point 2-Tone FFT, fIN = 21.6MHz and 23.6MHz, -1dB, 2V Range, 40Msps
0 -10 -20 -30
60000 50000 70000
AMPLITUDE (dB)
COUNT
-50 -60 -70 -80 -90 -100 -110 -120
40000 30000 20000 10000 1424 0 2558
SNR (dBFS)
-40
0
5
10 15 FREQUENCY (MHz)
8
UW
229321 G24
LTC2292: Typical DNL, 2V Range, 40Msps
1.00 0.75 0.50 0.25 0 -0.25 -0.50 -0.75 -1.00 0 1024 2048 CODE 3072 4096
229321 G19
LTC2292: 8192 Point FFT, fIN = 5MHz, -1dB, 2V Range, 40Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 FREQUENCY (MHz) 20
229321 G20
LTC2292: 8192 Point FFT, fIN = 70MHz, -1dB, 2V Range, 40Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 FREQUENCY (MHz) 20
229321 G22
LTC2292: 8192 Point FFT, fIN = 140MHz, -1dB, 2V Range, 40Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 0 5 10 15 FREQUENCY (MHz) 20
229321 G23
LTC2292: Grounded Input Histogram, 40Msps
72
61538
LTC2292: SNR vs Input Frequency, -1dB, 2V Range, 40Msps
71
70
69
68
2051 CODE 2052
229321 G25
20
2050
0
100 150 50 INPUT FREQUENCY (MHz)
200
229321 G26
229321f
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2292: SFDR vs Input Frequency, -1dB, 2V Range, 40Msps
100 95 100 90 110 SFDR
SNR AND SFDR (dBFS)
SNR (dBc AND dBFS)
SFDR (dBFS)
85 80 75 70 65 0 50 150 INPUT FREQUENCY (MHz) 100 200
229321 G27
LTC2292: SFDR vs Input Level, fIN = 5MHz, 2V Range, 40Msps
120 110 100
SNR (dBc AND dBFS)
100
dBFS
90 6
90
IVDD (mA)
80 70 60 50 40 30 20 -60 dBc 90dBc SFDR REFERENCE LINE
2V RANGE 80
IOVDD (mA)
-50
- 40
-30
-20
INPUT LEVEL (dBFS)
229321 G30
LTC2291: Typical INL, 2V Range, 25Msps
1.00 0.75 0.50 1.00 0.75 0.50
DNL ERROR (LSB)
INL ERROR (LSB)
AMPLITUDE (dB)
0.25 0 -0.25 -0.50 -0.75 -1.00 0 1024 2048 CODE 3072 4096
229321 G33
UW
-10
LTC2292: SNR and SFDR vs Sample Rate, 2V Range, fIN = 5MHz, -1dB
80 70 60 50 40 30 20 10
LTC2292: SNR vs Input Level, fIN = 5MHz, 2V Range, 40Msps
dBFS
90
dBc
80 SNR 70
60 0 20 40 60 SAMPLE RATE (Msps) 80
229321 G28
0 -60
-50
- 40 -30 -20 INPUT LEVEL (dBFS)
-10
0
229321 G29
LTC2292: IVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB
8
LTC2292: IOVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB, OVDD = 1.8V
4
1V RANGE 70 2
60
0
0
10
30 40 20 SAMPLE RATE (Msps)
50
229321 G31
0
0
10
30 40 20 SAMPLE RATE (Msps)
50
229321 G32
LTC2291: Typical DNL, 2V Range, 25Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110
-1.00 0 1024 2048 CODE 3072 4096
229321 G34
LTC2291: 8192 Point FFT, fIN = 5MHz, -1dB, 2V Range, 25Msps
0.25 0 -0.25 -0.50 -0.75
-120
0
2
4 6 8 FREQUENCY (MHz)
10
12
229321 G35
229321f
9
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2291: 8192 Point FFT, fIN = 30MHz, -1dB, 2V Range, 25Msps
0 -10 -20 -30
AMPLITUDE (dB)
-40 -50 -60 -70 -80 -90 -100 -110 -120 0 2 4 6 8 FREQUENCY (MHz) 10 12
229321 G36
AMPLITUDE (dB)
AMPLITUDE (dB)
LTC2291: 8192 Point 2-Tone FFT, fIN = 10.9MHz and 13.8MHz, -1dB, 2V Range, 25Msps
0 -10 -20 -30
60000 70000
AMPLITUDE (dB)
-40
COUNT
-50 -60 -70 -80 -90 -100 -110 -120 0 2 4 6 8 10 FREQUENCY (MHz) 12
229321 G39
40000 30000 20000 10000 2155 0 2048 2049 CODE 1607
SNR (dBFS)
LTC2291: SFDR vs Input Frequency, -1dB, 2V Range, 25Msps
100 95 100 90 110
SNR AND SFDR (dBFS)
SNR (dBc AND dBFS)
SFDR (dBFS)
85 80 75 70 65 0 50 150 INPUT FREQUENCY (MHz) 100 200
229321 G42
10
UW
LTC2291: 8192 Point FFT, fIN = 70MHz, -1dB, 2V Range, 25Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 0 2 4 6 8 FREQUENCY (MHz) 10 12
229321 G37
LTC2291: 8192 Point FFT, fIN = 140MHz, -1dB, 2V Range, 25Msps
0 -10 -20 -30 -40 -50 -60 -70 -80 -90 -100 -110 -120 0 2 4 6 8 FREQUENCY (MHz) 10 12
229321 G38
LTC2291: Grounded Input Histogram, 25Msps
72
61758
LTC2291: SNR vs Input Frequency, -1dB, 2V Range, 25Msps
71
50000
70
69
68
2050
229321 G40
0
100 150 50 INPUT FREQUENCY (MHz)
200
229321 G41
LTC2291: SNR and SFDR vs Sample Rate, 2V Range, fIN = 5MHz, -1dB
80 70 60 50 40 30 20 10
LTC2291: SNR vs Input Level, fIN = 5MHz, 2V Range, 25Msps
dBFS
SFDR
90
dBc
80 SNR 70
60 0 10 30 40 20 SAMPLE RATE (Msps) 50
229321 G43
0 -60
-50
- 40 -30 -20 INPUT LEVEL (dBFS)
-10
0
229321 G44
229321f
LTC2293/LTC2292/LTC2291 TYPICAL PERFOR A CE CHARACTERISTICS
LTC2291: SFDR vs Input Level, fIN = 5MHz, 2V Range, 25Msps
120 110 100 dBFS
SFDR (dBc AND dBFS)
90
dBc
2V RANGE 50 1V RANGE 40
70 60 50 40 30 20 -60 -50 - 40 -30 -20 INPUT LEVEL (dBFS) -10 0 90dBc SFDR REFERENCE LINE
IOVDD (mA) 2 0
IVDD (mA)
80
PI FU CTIO S
AINA+ (Pin 1): Channel A Positive Differential Analog Input. AINA- (Pin 2): Channel A Negative Differential Analog Input. REFHA (Pins 3, 4): Channel A High Reference. Short together and bypass to Pins 5, 6 with a 0.1F ceramic chip capacitor as close to the pin as possible. Also bypass to Pins 5, 6 with an additional 2.2F ceramic chip capacitor and to ground with a 1F ceramic chip capacitor. REFLA (Pins 5, 6): Channel A Low Reference. Short together and bypass to Pins 3, 4 with a 0.1F ceramic chip capacitor as close to the pin as possible. Also bypass to Pins 3, 4 with an additional 2.2F ceramic chip capacitor and to ground with a 1F ceramic chip capacitor. VDD (Pins 7, 10, 18, 63): Analog 3V Supply. Bypass to GND with 0.1F ceramic chip capacitors. CLKA (Pin 8): Channel A Clock Input. The input sample starts on the positive edge. CLKB (Pin 9): Channel B Clock Input. The input sample starts on the positive edge. REFLB (Pins 11, 12): Channel B Low Reference. Short together and bypass to Pins 13, 14 with a 0.1F ceramic chip capacitor as close to the pin as possible. Also bypass to Pins 13, 14 with an additional 2.2F ceramic chip capacitor and to ground with a 1F ceramic chip capacitor. REFHB (Pins 13, 14): Channel B High Reference. Short together and bypass to Pins 11, 12 with a 0.1F ceramic chip capacitor as close to the pin as possible. Also bypass to Pins 11, 12 with an additional 2.2F ceramic chip capacitor and to ground with a 1F ceramic chip capacitor. AINB- (Pin 15): Channel B Negative Differential Analog Input. AINB+ (Pin 16): Channel B Positive Differential Analog Input. GND (Pins 17, 64): ADC Power Ground. SENSEB (Pin 19): Channel B Reference Programming Pin. Connecting SENSEB to VCMB selects the internal reference and a 0.5V input range. VDD selects the internal reference and a 1V input range. An external reference greater than 0.5V and less than 1V applied to SENSEB selects an input range of VSENSEB. 1V is the largest valid input range. VCMB (Pin 20): Channel B 1.5V Output and Input Common Mode Bias. Bypass to ground with 2.2F ceramic chip capacitor. Do not connect to VCMA.
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LTC2291: IVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB
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LTC2291: IOVDD vs Sample Rate, 5MHz Sine Wave Input, -1dB, OVDD = 1.8V
6
60
4
30 0 5 25 20 15 10 SAMPLE RATE (Msps) 30 35
229321 G46
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25 20 15 10 SAMPLE RATE (Msps)
30
35
229321 G47
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LTC2293/LTC2292/LTC2291
PI FU CTIO S
MUX (Pin 21): Digital Output Multiplexer Control. If MUX is High, Channel A comes out on DA0-DA13, OFA; Channel B comes out on DB0-DB13, OFB. If MUX is Low, the output busses are swapped and Channel A comes out on DB0DB13, OFB; Channel B comes out on DA0-DA13, OFA. To multiplex both channels onto a single output bus, connect MUX, CLKA and CLKB together. SHDNB (Pin 22): Channel B Shutdown Mode Selection Pin. Connecting SHDNB to GND and OEB to GND results in normal operation with the outputs enabled. Connecting SHDNB to GND and OEB to VDD results in normal operation with the outputs at high impedance. Connecting SHDNB to VDD and OEB to GND results in nap mode with the outputs at high impedance. Connecting SHDNB to VDD and OEB to VDD results in sleep mode with the outputs at high impedance. OEB (Pin 23): Channel B Output Enable Pin. Refer to SHDNB pin function. NC (Pins 24, 25, 41, 42): Do Not Connect These Pins. DB0 - DB11 (Pins 26 to 30, 33 to 39): Channel B Digital Outputs. DB11 is the MSB. OGND (Pins 31, 50): Output Driver Ground. OVDD (Pins 32, 49): Positive Supply for the Output Drivers. Bypass to ground with 0.1F ceramic chip capacitor. OFB (Pin 40): Channel B Overflow/Underflow Output. High when an overflow or underflow has occurred. DA0 - DA11 (Pins 43 to 48, 51 to 56): Channel A Digital Outputs. DA11 is the MSB. OFA (Pin 57): Channel A Overflow/Underflow Output. High when an overflow or underflow has occurred. OEA (Pin 58): Channel A Output Enable Pin. Refer to SHDNA pin function. SHDNA (Pin 59): Channel A Shutdown Mode Selection Pin. Connecting SHDNA to GND and OEA to GND results in normal operation with the outputs enabled. Connecting SHDNA to GND and OEA to VDD results in normal operation with the outputs at high impedance. Connecting SHDNA to VDD and OEA to GND results in nap mode with the outputs at high impedance. Connecting SHDNA to VDD and OEA to VDD results in sleep mode with the outputs at high impedance. MODE (Pin 60): Output Format and Clock Duty Cycle Stabilizer Selection Pin. Note that MODE controls both channels. Connecting MODE to GND selects straight binary output format and turns the clock duty cycle stabilizer off. 1/3 VDD selects straight binary output format and turns the clock duty cycle stabilizer on. 2/3 VDD selects 2's complement output format and turns the clock duty cycle stabilizer on. VDD selects 2's complement output format and turns the clock duty cycle stabilizer off. VCMA (Pin 61): Channel A 1.5V Output and Input Common Mode Bias. Bypass to ground with 2.2F ceramic chip capacitor. Do not connect to VCMB. SENSEA (Pin 62): Channel A Reference Programming Pin. Connecting SENSEA to VCMA selects the internal reference and a 0.5V input range. VDD selects the internal reference and a 1V input range. An external reference greater than 0.5V and less than 1V applied to SENSEA selects an input range of VSENSEA. 1V is the largest valid input range. GND (Exposed Pad) (Pin 65): ADC Power Ground. The Exposed Pad on the bottom of the package needs to be soldered to ground.
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FUNCTIONAL BLOCK DIAGRA
AIN+ INPUT S/H FIRST PIPELINED ADC STAGE SECOND PIPELINED ADC STAGE AIN-
VCM 2.2F
1.5V REFERENCE
RANGE SELECT
REFH SENSE REF BUF
DIFF REF AMP
REFH
0.1F
2.2F 1F 1F
Figure 1. Functional Block Diagram (Only One Channel is Shown)
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THIRD PIPELINED ADC STAGE FOURTH PIPELINED ADC STAGE FIFTH PIPELINED ADC STAGE SIXTH PIPELINED ADC STAGE SHIFT REGISTER AND CORRECTION REFL INTERNAL CLOCK SIGNALS OVDD OF CLOCK/DUTY CYCLE CONTROL D11 CONTROL LOGIC OUTPUT DRIVERS * * * D0 REFL CLK MODE SHDN OE
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OGND
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LTC2293/LTC2292/LTC2291
TI I G DIAGRA S
Dual Digital Output Bus Timing (Only One Channel is Shown)
tAP ANALOG INPUT N N+1 tH CLK tD D0-D11, OF N-6 N-5 N-4 N-3 N-2 N-1
229321 TD01
ANALOG INPUT A
ANALOG INPUT B
CLKA = CLKB = MUX
D0A-D11A, OFA
D0B-D11B, OFB
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N+2 N+3
N+4 N+5
tL
Multiplexed Digital Output Bus Timing
tAPA A A+1 tAPB B B+1 tH tL B+2 B+3 B+4 A+2 A+3 A+4
A-6 tD B-6
B-6
A-5
B-5 t MD
A-4
B-4
A-3
B-3
A-2
A-6
B-5
A-5
B-4
A-4
B-3
A-3
B-2
229321 TD02
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LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
DYNAMIC PERFORMANCE Signal-to-Noise Plus Distortion Ratio The signal-to-noise plus distortion ratio [S/(N + D)] is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components at the ADC output. The output is band limited to frequencies above DC to below half the sampling frequency. Signal-to-Noise Ratio The signal-to-noise ratio (SNR) is the ratio between the RMS amplitude of the fundamental input frequency and the RMS amplitude of all other frequency components except the first five harmonics and DC. Total Harmonic Distortion Total harmonic distortion is the ratio of the RMS sum of all harmonics of the input signal to the fundamental itself. The out-of-band harmonics alias into the frequency band between DC and half the sampling frequency. THD is expressed as: THD = 20Log (V22 + V32 + V42 + . . . Vn2)/V1 where V1 is the RMS amplitude of the fundamental frequency and V2 through Vn are the amplitudes of the second through nth harmonics. The THD calculated in this data sheet uses all the harmonics up to the fifth. Intermodulation Distortion If the ADC input signal consists of more than one spectral component, the ADC transfer function nonlinearity can produce intermodulation distortion (IMD) in addition to THD. IMD is the change in one sinusoidal input caused by the presence of another sinusoidal input at a different frequency. If two pure sine waves of frequencies fa and fb are applied to the ADC input, nonlinearities in the ADC transfer function can create distortion products at the sum and difference frequencies of mfa nfb, where m and n = 0, 1, 2, 3, etc. The 3rd order intermodulation products are 2fa + fb, Aperture Delay Time The time from when CLK reaches midsupply to the instant that the input signal is held by the sample and hold circuit. Aperture Delay Jitter The variation in the aperture delay time from conversion to conversion. This random variation will result in noise when sampling an AC input. The signal to noise ratio due to the jitter alone will be: SNRJITTER = -20log (2) * fIN * tJITTER Crosstalk Crosstalk is the coupling from one channel (being driven by a full-scale signal) onto the other channel (being driven by a -1dBFS signal). CONVERTER OPERATION As shown in Figure 1, the LTC2293/LTC2292/LTC2291 are dual CMOS pipelined multistep converters. The converters have six pipelined ADC stages; a sampled analog input will result in a digitized value six cycles later (see the Timing Diagram section). For optimal AC performance the analog inputs should be driven differentially. For cost
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2fb + fa, 2fa - fb and 2fb - fa. The intermodulation distortion is defined as the ratio of the RMS value of either input tone to the RMS value of the largest 3rd order intermodulation product. Spurious Free Dynamic Range (SFDR) Spurious free dynamic range is the peak harmonic or spurious noise that is the largest spectral component excluding the input signal and DC. This value is expressed in decibels relative to the RMS value of a full scale input signal. Input Bandwidth The input bandwidth is that input frequency at which the amplitude of the reconstructed fundamental is reduced by 3dB for a full scale input signal.
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LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
sensitive applications, the analog inputs can be driven single-ended with slightly worse harmonic distortion. The CLK input is single-ended. The LTC2293/LTC2292/ LTC2291 have two phases of operation, determined by the state of the CLK input pin. Each pipelined stage shown in Figure 1 contains an ADC, a reconstruction DAC and an interstage residue amplifier. In operation, the ADC quantizes the input to the stage and the quantized value is subtracted from the input by the DAC to produce a residue. The residue is amplified and output by the residue amplifier. Successive stages operate out of phase so that when the odd stages are outputting their residue, the even stages are acquiring that residue and vice versa. When CLK is low, the analog input is sampled differentially directly onto the input sample-and-hold capacitors, inside the "Input S/H" shown in the block diagram. At the instant that CLK transitions from low to high, the sampled input is held. While CLK is high, the held input voltage is buffered by the S/H amplifier which drives the first pipelined ADC stage. The first stage acquires the output of the S/H during this high phase of CLK. When CLK goes back low, the first stage produces its residue which is acquired by the second stage. At the same time, the input S/H goes back to acquiring the analog input. When CLK goes back high, the second stage produces its residue which is acquired by the third stage. An identical process is repeated for the
LTC2293/LTC2292/LTC2291 VDD 15 CPARASITIC 1pF
AIN+
VDD 15
AIN-
CLK
Figure 2. Equivalent Input Circuit
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third, fourth and fifth stages, resulting in a fifth stage residue that is sent to the sixth stage ADC for final evaluation. Each ADC stage following the first has additional range to accommodate flash and amplifier offset errors. Results from all of the ADC stages are digitally synchronized such that the results can be properly combined in the correction logic before being sent to the output buffer. SAMPLE/HOLD OPERATION AND INPUT DRIVE Sample/Hold Operation Figure 2 shows an equivalent circuit for the LTC2293/ LTC2292/LTC2291 CMOS differential sample-and-hold. The analog inputs are connected to the sampling capacitors (CSAMPLE) through NMOS transistors. The capacitors shown attached to each input (CPARASITIC) are the summation of all other capacitance associated with each input. During the sample phase when CLK is low, the transistors connect the analog inputs to the sampling capacitors and they charge to and track the differential input voltage. When CLK transitions from low to high, the sampled input voltage is held on the sampling capacitors. During the hold phase when CLK is high, the sampling capacitors are disconnected from the input and the held voltage is passed to the ADC core for processing. As CLK transitions from high to low, the inputs are reconnected to the sampling
CSAMPLE 4pF CSAMPLE 4pF CPARASITIC 1pF VDD
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LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
capacitors to acquire a new sample. Since the sampling capacitors still hold the previous sample, a charging glitch proportional to the change in voltage between samples will be seen at this time. If the change between the last sample and the new sample is small, the charging glitch seen at the input will be small. If the input change is large, such as the change seen with input frequencies near Nyquist, then a larger charging glitch will be seen. Single-Ended Input For cost sensitive applications, the analog inputs can be driven single-ended. With a single-ended input the harmonic distortion and INL will degrade, but the SNR and DNL will remain unchanged. For a single-ended input, AIN+ should be driven with the input signal and AIN- should be connected to 1.5V or VCM. Common Mode Bias For optimal performance the analog inputs should be driven differentially. Each input should swing 0.5V for the 2V range or 0.25V for the 1V range, around a common mode voltage of 1.5V. The VCM output pin may be used to provide the common mode bias level. VCM can be tied directly to the center tap of a transformer to set the DC input level or as a reference level to an op amp differential driver circuit. The VCM pin must be bypassed to ground close to the ADC with a 2.2F or greater capacitor. Input Drive Impedance As with all high performance, high speed ADCs, the dynamic performance of the LTC2293/LTC2292/LTC2291 can be influenced by the input drive circuitry, particularly the second and third harmonics. Source impedance and reactance can influence SFDR. At the falling edge of CLK, the sample-and-hold circuit will connect the 4pF sampling capacitor to the input pin and start the sampling period. The sampling period ends when CLK rises, holding the sampled input on the sampling capacitor. Ideally the input circuitry should be fast enough to fully charge the sampling capacitor during the sampling period 1/(2FENCODE); however, this is not always possible and the incomplete settling may degrade the SFDR. The sampling
25 T1 = MA/COM ETC1-1T 25 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE
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glitch has been designed to be as linear as possible to minimize the effects of incomplete settling. For the best performance, it is recommended to have a source impedance of 100 or less for each input. The source impedance should be matched for the differential inputs. Poor matching will result in higher even order harmonics, especially the second. Input Drive Circuits Figure 3 shows the LTC2293/LTC2292/LTC2291 being driven by an RF transformer with a center tapped secondary. The secondary center tap is DC biased with VCM, setting the ADC input signal at its optimum DC level. Terminating on the transformer secondary is desirable, as this provides a common mode path for charging glitches caused by the sample and hold. Figure 3 shows a 1:1 turns ratio transformer. Other turns ratios can be used if the source impedance seen by the ADC does not exceed 100 for each ADC input. A disadvantage of using a transformer is the loss of low frequency response. Most small RF transformers have poor performance at frequencies below 1MHz.
VCM 2.2F 0.1F ANALOG INPUT T1 1:1 25 25 0.1F 12pF AIN-
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AIN+
LTC2293 LTC2292 LTC2291
Figure 3. Single-Ended to Differential Conversion Using a Transformer
Figure 4 demonstrates the use of a differential amplifier to convert a single ended input signal into a differential input signal. The advantage of this method is that it provides low frequency input response; however, the limited gain bandwidth of most op amps will limit the SFDR at high input frequencies.
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APPLICATIO S I FOR ATIO
VCM HIGH SPEED DIFFERENTIAL 25 AMPLIFIER ANALOG INPUT 2.2F AIN+ 0.1F LTC2293 LTC2292 LTC2291 ANALOG INPUT 25 T1 0.1F 25 12 12 0.1F 8pF AIN-
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CM
+
12pF
-
-
25
AIN-
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Figure 4. Differential Drive with an Amplifier
Figure 5 shows a single-ended input circuit. The impedance seen by the analog inputs should be matched. This circuit is not recommended if low distortion is required.
VCM 1k 0.1F ANALOG INPUT 1k 25 2.2F AIN+ LTC2293 LTC2292 LTC2291
12pF 25 0.1F AIN-
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Figure 5. Single-Ended Drive
The 25 resistors and 12pF capacitor on the analog inputs serve two purposes: isolating the drive circuitry from the sample-and-hold charging glitches and limiting the wideband noise at the converter input. For input frequencies above 70MHz, the input circuits of Figure 6, 7 and 8 are recommended. The balun transformer gives better high frequency response than a flux coupled center tapped transformer. The coupling capacitors allow the analog inputs to be DC biased at 1.5V. In Figure 8, the series inductors are impedance matching elements that maximize the ADC bandwidth.
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VCM 2.2F AIN+ LTC2293 LTC2292 LTC2291 T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE
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Figure 6. Recommended Front End Circuit for Input Frequencies Between 70MHz and 170MHz
VCM 2.2F 0.1F ANALOG INPUT 25 T1 0.1F 25 T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS ARE 0402 PACKAGE SIZE AIN-
229321 F07
AIN+ 0.1F
LTC2293 LTC2292 LTC2291
Figure 7. Recommended Front End Circuit for Input Frequencies Between 170MHz and 300MHz
VCM 2.2F 0.1F ANALOG INPUT 25 T1 0.1F 25 6.8nH
-
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6.8nH 0.1F
AIN+
LTC2293 LTC2292 LTC2291
AIN T1 = MA/COM, ETC 1-1-13 RESISTORS, CAPACITORS, INDUCTORS ARE 0402 PACKAGE SIZE
Figure 8. Recommended Front End Circuit for Input Frequencies Above 300MHz
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APPLICATIO S I FOR ATIO
Reference Operation Figure 9 shows the LTC2293/LTC2292/LTC2291 reference circuitry consisting of a 1.5V bandgap reference, a difference amplifier and switching and control circuit. The internal voltage reference can be configured for two pin selectable input ranges of 2V (1V differential) or 1V (0.5V differential). Tying the SENSE pin to VDD selects the 2V range; tying the SENSE pin to VCM selects the 1V range. The 1.5V bandgap reference serves two functions: its output provides a DC bias point for setting the common mode voltage of any external input circuitry; additionally, the reference is used with a difference amplifier to generate the differential reference levels needed by the internal ADC circuitry. An external bypass capacitor is required for the 1.5V reference output, VCM. This provides a high frequency low impedance path to ground for internal and external circuitry.
LTC2293/LTC2292/LTC2291 1.5V VCM 2.2F 1V RANGE DETECT AND CONTROL SENSE BUFFER INTERNAL ADC HIGH REFERENCE REFH 0.5V 4 1.5V BANDGAP REFERENCE
1.5V VCM 2.2F 12k 0.75V 12k SENSE 1F LTC2293 LTC2292 LTC2291
TIE TO VDD FOR 2V RANGE; TIE TO VCM FOR 1V RANGE; RANGE = 2 * VSENSE FOR 0.5V < VSENSE < 1V 1F
2.2F
0.1F
DIFF AMP
1F REFL INTERNAL ADC LOW REFERENCE
229321 F09
Figure 9. Equivalent Reference Circuit
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The difference amplifier generates the high and low reference for the ADC. High speed switching circuits are connected to these outputs and they must be externally bypassed. Each output has two pins. The multiple output pins are needed to reduce package inductance. Bypass capacitors must be connected as shown in Figure 9. Each ADC channel has an independent reference with its own bypass capacitors. The two channels can be used with the same or different input ranges. Other voltage ranges between the pin selectable ranges can be programmed with two external resistors as shown in Figure 10. An external reference can be used by applying its output directly or through a resistor divider to SENSE. It is not recommended to drive the SENSE pin with a logic device. The SENSE pin should be tied to the appropriate level as close to the converter as possible. If the SENSE pin is driven externally, it should be bypassed to ground as close to the device as possible with a 1F ceramic capacitor. For the best channel matching, connect an external reference to SENSEA and SENSEB.
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Figure 10. 1.5V Range ADC
Input Range The input range can be set based on the application. The 2V input range will provide the best signal-to-noise performance while maintaining excellent SFDR. The 1V input range will have better SFDR performance, but the SNR will degrade by 3.8dB. See the Typical Performance Characteristics section. Driving the Clock Input The CLK inputs can be driven directly with a CMOS or TTL level signal. A sinusoidal clock can also be used along with a low jitter squaring circuit before the CLK pin (Figure 11).
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APPLICATIO S I FOR ATIO
4.7F FERRITE BEAD 0.1F SINUSOIDAL CLOCK INPUT 0.1F 1k CLK 50 1k NC7SVU04 CLEAN SUPPLY
LTC2293 LTC2292 LTC2291
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Figure 11. Sinusoidal Single-Ended CLK Drive
The noise performance of the LTC2293/LTC2292/LTC2291 can depend on the clock signal quality as much as on the analog input. Any noise present on the clock signal will result in additional aperture jitter that will be RMS summed with the inherent ADC aperture jitter. In applications where jitter is critical, such as when digitizing high input frequencies, use as large an amplitude as possible. Also, if the ADC is clocked with a sinusoidal signal, filter the CLK signal to reduce wideband noise and distortion products generated by the source. It is recommended that CLKA and CLKB are shorted together and driven by the same clock source. If a small time delay is desired between when the two channels sample the analog inputs, CLKA and CLKB can be driven by two different signals. If this delay exceeds 1ns, the performance of the part may degrade. CLKA and CLKB should not be driven by asynchronous signals. Maximum and Minimum Conversion Rates The maximum conversion rate for the LTC2293/LTC2292/ LTC2291 is 65Msps (LTC2293), 40Msps (LTC2292), and 25Msps (LTC2291). For the ADC to operate properly, the CLK signal should have a 50% (5%) duty cycle. Each half cycle must have at least 7.3ns (LTC2293), 11.8ns (LTC2292), and 18.9ns (LTC2291) for the ADC internal circuitry to have enough settling time for proper operation.
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An optional clock duty cycle stabilizer circuit can be used if the input clock has a non 50% duty cycle. This circuit uses the rising edge of the CLK pin to sample the analog input. The falling edge of CLK is ignored and the internal falling edge is generated by a phase-locked loop. The input clock duty cycle can vary from 40% to 60% and the clock duty cycle stabilizer will maintain a constant 50% internal duty cycle. If the clock is turned off for a long period of time, the duty cycle stabilizer circuit will require a hundred clock cycles for the PLL to lock onto the input clock. To use the clock duty cycle stabilizer, the MODE pin should be connected to 1/3VDD or 2/3VDD using external resistors. The MODE pin controls both Channel A and Channel B--the duty cycle stabilizer is either on or off for both channels. The lower limit of the LTC2293/LTC2292/LTC2291 sample rate is determined by droop of the sample-and-hold circuits. The pipelined architecture of this ADC relies on storing analog signals on small valued capacitors. Junction leakage will discharge the capacitors. The specified minimum operating frequency for the LTC2293/LTC2292/ LTC2291 is 1Msps. DIGITAL OUTPUTS Digital Output Buffers Figure 12 shows an equivalent circuit for a single output buffer. Each buffer is powered by OVDD and OGND, isolated from the ADC power and ground. The additional N-channel transistor in the output driver allows operation down to low voltages. The internal resistor in series with the output makes the output appear as 50 to external circuitry and may eliminate the need for external damping resistors. As with all high speed/high resolution converters, the digital output loading can affect the performance. The digital outputs of the LTC2293/LTC2292/LTC2291 should drive a minimal capacitive load to avoid possible interaction
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LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
LTC2293/LTC2292/LTC2291 VDD VDD
DATA FROM LATCH OE
PREDRIVER LOGIC
Figure 12. Digital Output Buffer
between the digital outputs and sensitive input circuitry. The output should be buffered with a device such as an ALVCH16373 CMOS latch. For full speed operation the capacitive load should be kept under 10pF. Lower OVDD voltages will also help reduce interference from the digital outputs. Data Format Using the MODE pin, the LTC2293/LTC2292/LTC2291 parallel digital output can be selected for offset binary or 2's complement format. Note that MODE controls both Channel A and Channel B. Connecting MODE to GND or 1/3VDD selects straight binary output format. Connecting MODE to 2/3VDD or VDD selects 2's complement output format. An external resistor divider can be used to set the 1/3VDD or 2/3VDD logic values. Table 1 shows the logic states for the MODE pin.
Table 1. MODE Pin Function
MODE Pin 0 1/3VDD 2/3VDD VDD Output Format Straight Binary Straight Binary 2's Complement 2's Complement Clock Duty Cycle Stabilizer Off On On Off
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OVDD 0.5V TO VDD 0.1F OVDD 43 TYPICAL DATA OUTPUT OGND
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Overflow Bit When OF outputs a logic high the converter is either overranged or underranged. Output Driver Power Separate output power and ground pins allow the output drivers to be isolated from the analog circuitry. The power supply for the digital output buffers, OVDD, should be tied to the same power supply as for the logic being driven. For example, if the converter is driving a DSP powered by a 1.8V supply, then OVDD should be tied to that same 1.8V supply. OVDD can be powered with any voltage from 500mV up to 3.6V. OGND can be powered with any voltage from GND up to 1V and must be less than OVDD. The logic outputs will swing between OGND and OVDD. Output Enable The outputs may be disabled with the output enable pin, OE. OE high disables all data outputs including OF. The data access and bus relinquish times are too slow to allow the outputs to be enabled and disabled during full speed operation. The output Hi-Z state is intended for use during long periods of inactivity. Channels A and B have independent output enable pins (OEA, OEB).
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Sleep and Nap Modes
The converter may be placed in shutdown or nap modes to conserve power. Connecting SHDN to GND results in normal operation. Connecting SHDN to VDD and OE to VDD results in sleep mode, which powers down all circuitry including the reference and typically dissipates 1mW. When exiting sleep mode it will take milliseconds for the output data to become valid because the reference capacitors have to recharge and stabilize. Connecting SHDN to VDD and OE to GND results in nap mode, which typically dissipates 30mW. In nap mode, the on-chip reference circuit is kept on, so that recovery from nap mode is faster than that from sleep mode, typically taking 100 clock cycles. In both sleep and nap modes, all digital outputs are disabled and enter the Hi-Z state. Channels A and B have independent SHDN pins (SHDNA, SHDNB). Channel A is controlled by SHDNA and OEA, and Channel B is controlled by SHDNB and OEB. The nap, sleep and output enable modes of the two channels are completely independent, so it is possible to have one channel operating while the other channel is in nap or sleep mode. Digital Output Multiplexer The digital outputs of the LTC2293/LTC2292/LTC2291 can be multiplexed onto a single data bus. The MUX pin is a digital input that swaps the two data busses. If MUX is High, Channel A comes out on DA0-DA11, OFA; Channel B comes out on DB0-DB11, OFB. If MUX is Low, the output busses are swapped and Channel A comes out on DB0-DB11, OFB; Channel B comes out on DA0-DA11, OFA. To multiplex both channels onto a single output bus, connect MUX, CLKA and CLKB together (see the Timing Diagram for the multiplexed mode). The multiplexed data is available on either data bus--the unused data bus can be disabled with its OE pin.
22
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Grounding and Bypassing The LTC2293/LTC2292/LTC2291 requires a printed circuit board with a clean, unbroken ground plane. A multilayer board with an internal ground plane is recommended. Layout for the printed circuit board should ensure that digital and analog signal lines are separated as much as possible. In particular, care should be taken not to run any digital track alongside an analog signal track or underneath the ADC. High quality ceramic bypass capacitors should be used at the VDD, OVDD, VCM, REFH, and REFL pins. Bypass capacitors must be located as close to the pins as possible. Of particular importance is the 0.1F capacitor between REFH and REFL. This capacitor should be placed as close to the device as possible (1.5mm or less). A size 0402 ceramic capacitor is recommended. The large 2.2F capacitor between REFH and REFL can be somewhat further away. The traces connecting the pins and bypass capacitors must be kept short and should be made as wide as possible. The LTC2293/LTC2292/LTC2291 differential inputs should run parallel and close to each other. The input traces should be as short as possible to minimize capacitance and to minimize noise pickup. Heat Transfer Most of the heat generated by the LTC2293/LTC2292/ LTC2291 is transferred from the die through the bottomside exposed pad and package leads onto the printed circuit board. For good electrical and thermal performance, the exposed pad should be soldered to a large grounded pad on the PC board. It is critical that all ground pins are connected to a ground plane of sufficient area.
229321f
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U
U
VCC JP1 MODE VDD 1 2 4 6 8 C1 0.1F RN1D 33 RN1C 33 RN1B 33 RN1A 33 RN2D 33 VDD
64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49
JP2 SENSE A 3 5 7 GND C2 2.2F 1/3VDD 2/3VDD R2 1k R3 1k C44 0.1F 74VCX245BQX
R1 1k
3
VCM
4
E1 EXT REF A
EXT REF 5 6
20 VCC 18 2 A0 B0 17 3 A1 B1 16 4 B2 A2 15 5 A3 B3 14 6 B4 A4 13 7 A5 B5 12 8 A6 B6 11 9 A7 B7 1 T/R 19 10 OE GND
J2 ANALOG R4 INPUT A OPT VCC C6 12pF C4 0.1F VCC C5 0.1F
R5 24.9
C3 T1 0.1F ETC1-1T 5 1
2
R6 24.9
RN2C 33 RN2B 33 RN2A 33 RN3D 33 RN3C 33 RN3B 33 RN3A 33 RN4D 33 RN4C 33 RN4B 33
34 32 30 28 26 24 22 20 18 16 14 14
APPLICATIO S I FOR ATIO
4
GND VDD SENSEA VCMA MODE SHDNA OEA OFA DA11 DA10 DA9 DA8 DA7 DA6 OGND OVDD
*
*3
R7 24.9
R8 51 C9 1F C10 2.2F C13 1F U1 LTC2293 C11 0.1F
L1 BEAD
C12 4.7F 6.3V
VCMA
R9 24.9 C8 0.1F
3201S-40G1 39 40 39 37 38 37 35 35 36 33 34 33 31 31 32 29 30 29 27 27 28 25 25 26 23 23 24 21 21 22 19 19 20 17 17 18 15 15 16 13
VDD
VDD
C14 0.1F
R10 1k C18 1F C20 2.2F C21 0.1F C23 1F
GND VDD SENSEB VCMB MUX SHDNB OEB NC NC DB0 DB1 DB2 DB3 DB4 OGND OVDD
C15 0.1F
VDD
20 VCC 18 2 A0 B0 17 3 A1 B1 16 4 B2 A2 15 5 A3 B3 14 6 B4 A4 13 7 A5 B5 12 8 A6 B6 11 9 B7 A7 1 T/R 19 10 OE GND 74VCX245BQX VCC
C16 0.1F
13 11 11 9 9 7 7 5
J3 CLOCK INPUT
C19 0.1F
U3 NC7SVU04
C17 0.1F
5 3 3 1 1 R11 10k R12 10k C24 0.1F R13 10k
R14 49.9 VCC C25 0.1F VCC R27 TBD
R15 1k
C13 0.1F
1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 AINA+ AINA- REFHA REFHA REFLA REFLA VDD CLKA CLKB VDD REFLB REFLB REFHB REFHB AINB- AINB+ DA5 DA4 DA3 DA2 DA1 DA0 NC NC OFB DB11 DB10 DB9 DB8 DB7 DB6 DB5 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33
12 12 10 10 8 8 6 6 4 4 2 2
R32 22
17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32
U6 NC7SVU04 VDD C27 0.1F VCC R25 105k U8 LT1763 VDD
R16 33 VDD R18 24.9 VCMB R20 24.9 JP3 SENSE C31 12pF VDD VCMB E2 EXT REF B C35 0.1F EXT REF 5 6 3 4 VCM C37 10F 6.3V R26 100k 1 2 VDD R22 24.9 C28 2.2F
VCC
U4 NC7SV86P5X
1 A0 2 A1 3 A2 4 A3
8 VCC 7 WP 6 SCL 5 SDA U5 24LC025 VDD R31 TBD U10 NC7SV86P5X E4 GND E3 VDD 3V VCC C26 0.1F C36 E5 4.7F PWR GND
R30 15
J4 ANALOG R17 INPUT B OPT 2
C29 T2 0.1F ETC1-1T 4 1
5
*
*3
C33 0.1F R24 24.9 C34 0.1F
R23 51
1 8 IN OUT 2 7 ADJ GND 3 6 GND GND 4 5 BYP SHDN C38 0.01F
VCC C39 1F
U7 NC7SV86P5X
R29 51
L2 47nH C30 18pF C40 0.1F C41 0.1F
L3 47nH C32 18pF
L4 47nH C42 8.2pF
R28 24 C43 8.2pF
VCMB
228876 AI01
U
LTC2293/LTC2292/LTC2291
C7 0.1F
W
VCMA
40 38 36
U
VDD
1
VDD
2
U
VDD
23
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LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
24
U
Silkscreen Top Top Side
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U
U
LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
U
Inner Layer 2 GND Inner Layer 3 Power
229321f
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U
U
25
LTC2293/LTC2292/LTC2291
APPLICATIO S I FOR ATIO
26
U
Bottom Side
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LTC2293/LTC2292/LTC2291
PACKAGE DESCRIPTIO
0.25 0.05 0.50 BSC RECOMMENDED SOLDER PAD PITCH AND DIMENSIONS 0.75 0.05 R = 0.115 TYP
9 .00 0.10 (4 SIDES)
PIN 1 TOP MARK (SEE NOTE 5)
0.00 - 0.05 NOTE: 1. DRAWING CONFORMS TO JEDEC PACKAGE OUTLINE MO-220 VARIATION WNJR-5 2. ALL DIMENSIONS ARE IN MILLIMETERS 3. DIMENSIONS OF EXPOSED PAD ON BOTTOM OF PACKAGE DO NOT INCLUDE MOLD FLASH. MOLD FLASH, IF PRESENT, SHALL NOT EXCEED 0.20mm ON ANY SIDE, IF PRESENT 4. EXPOSED PAD SHALL BE SOLDER PLATED 5. SHADED AREA IS ONLY A REFERENCE FOR PIN 1 LOCATION ON THE TOP AND BOTTOM OF PACKAGE 6. DRAWING NOT TO SCALE
Information furnished by Linear Technology Corporation is believed to be accurate and reliable. However, no responsibility is assumed for its use. Linear Technology Corporation makes no representation that the interconnection of its circuits as described herein will not infringe on existing patent rights.
U
UP Package 64-Lead Plastic QFN (9mm x 9mm)
(Reference LTC DWG # 05-08-1705)
0.70 0.05 7.15 0.05 8.10 0.05 9.50 0.05 (4 SIDES) PACKAGE OUTLINE 63 64 0.40 0.10 1 2 PIN 1 CHAMFER 7.15 0.10 (4-SIDES)
(UP64) QFN 1003
0.200 REF
0.25 0.05 0.50 BSC BOTTOM VIEW--EXPOSED PAD
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LTC2293/LTC2292/LTC2291
RELATED PARTS
PART NUMBER LTC1403A/LTC1403 LTC1407A/LTC1407 LTC1749 LTC1750 LTC2225 LTC2226 LTC2227 LTC2228 LTC2229 LTC2236 LTC2237 LTC2238 LTC2239 LTC2245 LTC2246 LTC2247 LTC2248 LTC2249 LTC2286 LTC2287 LTC2288 LTC2289 LTC2290 LTC2294 LTC2295 LTC2296 LTC2297 LTC2298 LTC2299 LT5512 LT5514 LT5515 LT5516 LT5517 LT5522 DESCRIPTION 14-Bit/12-Bit 2.8Msps Serial ADC 14-Bit/12-Bit 3Msps, Simultaneous Sampling Serial ADC 12-Bit, 80Msps Wideband ADC 14-Bit, 80Msps Wideband ADC 12-Bit, 10Msps ADC 12-Bit, 25Msps ADC 12-Bit, 40Msps ADC 12-Bit, 65Msps ADC 12-Bit, 80Msps ADC 10-Bit, 25Msps ADC 10-Bit, 40Msps ADC 10-Bit, 65Msps ADC 10-Bit, 80Msps ADC 14-Bit, 10Msps ADC 14-Bit, 25Msps ADC 14-Bit, 40Msps ADC 14-Bit, 65Msps ADC 14-Bit, 80Msps ADC Dual 10-Bit, 25Msps ADC Dual 10-Bit, 40Msps ADC Dual 10-Bit, 65Msps ADC Dual 10-Bit, 80Msps ADC Dual 12-Bit, 10Msps ADC Dual 12-Bit, 80Msps ADC Dual 14-Bit, 10Msps ADC Dual 14-Bit, 25Msps ADC Dual 14-Bit, 40Msps ADC Dual 14-Bit, 65Msps ADC Dual 14-Bit, 80Msps ADC DC-3GHz High Signal Level Downconverting Mixer Ultralow Distortion IF Amplifier/ADC Driver with Digitally Controlled Gain 1.5GHz to 2.5GHz Direct Conversion Quadrature Demodulator 0.8GHz to 1.5GHz Direct Conversion Quadrature Demodulator 40MHz to 900MHz Direct Conversion Quadrature Demodulator 600MHz to 2.7GHz High Linearity Downconverting Mixer COMMENTS 3V, 14mW, Differential Input, MSOP Package 3V, 14mW, 2-Ch. Differential Input, MSOP Package Up to 500MHz IF Undersampling, 87dB SFDR Up to 500MHz IF Undersampling, 90dB SFDR 60mW, 71dB SNR, 5mm x 5mm QFN 75mW, 71dB SNR, 5mm x 5mm QFN 125mW, 71dB SNR, 5mm x 5mm QFN 205mW, 71dB SNR, 5mm x 5mm QFN 211mW, 70.6dB SNR, 5mm x 5mm QFN 75mW, 61dB SNR, 5mm x 5mm QFN 125mW, 61dB SNR, 5mm x 5mm QFN 205mW, 61dB SNR, 5mm x 5mm QFN 211mW, 61dB SNR, 5mm x 5mm QFN 60mW, 74.4dB SNR, 5mm x 5mm QFN 75mW, 74dB SNR, 5mm x 5mm QFN 125mW, 74dB SNR, 5mm x 5mm QFN 205mW, 74dB SNR, 5mm x 5mm QFN 222mW, 73dB SNR, 5mm x 5mm QFN 150mW, 61dB SNR, 9mm x 9mm QFN 235mW, 61dB SNR, 9mm x 9mm QFN 400mW, 61dB SNR, 9mm x 9mm QFN 445mW, 61dB SNR, 9mm x 9mm QFN 120mW, 71dB SNR, 9mm x 9mm QFN 445mW, 70.6dB SNR, 9mm x 9mm QFN 120mW, 74.4dB SNR, 9mm x 9mm QFN 150mW, 74dB SNR, 9mm x 9mm QFN 235mW, 74dB SNR, 9mm x 9mm QFN 400mW, 74dB SNR, 9mm x 9mm QFN 445mW, 73dB SNR, 9mm x 9mm QFN DC to 3GHz, 21dBm IIP3, Integrated LO Buffer 450MHz 1dB BW, 47dB OIP3, Digital Gain Control 10.5dB to 33dB in 1.5dB/Step 20dBm IIP3, Integrated LO Quadrature Generator 21.5dBm IIP3, Integrated LO Quadrature Generator 21dBm IIP3, Integrated LO Quadrature Generator 4.5V to 5.25V Supply, 25dBm IIP3 at 900MHz, NF = 12.5dB, 50 Single Ended RF and LO Ports
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Linear Technology Corporation
1630 McCarthy Blvd., Milpitas, CA 95035-7417
(408) 432-1900 FAX: (408) 434-0507
LT/TP 1204 1K * PRINTED IN USA
www.linear.com
(c) LINEAR TECHNOLOGY CORPORATION 2004


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